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Perovskite oxynitride LaTiOxNy thin films: dielectric characterization in low and high frequencies

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https://hal.archives-ouvertes.fr/hal-00567544
Contributor : Laurent Le Gendre Connect in order to contact the contributor
Submitted on : Monday, February 21, 2011 - 2:25:15 PM
Last modification on : Wednesday, April 27, 2022 - 4:14:01 AM

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  • HAL Id : hal-00567544, version 1

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Yu Lu, Ahmed Ziani, Claire Le Paven-Thivet, Ratiba Benzerga, Laurent Le Gendre, et al.. Perovskite oxynitride LaTiOxNy thin films: dielectric characterization in low and high frequencies. 17 International Vacuum Congress, Aug 2010, Pékin, China. ⟨hal-00567544⟩

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