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hal-01116322v1  Journal articles
Mourad LarbiPhilippe BesnierBernard Pecqueux. Probability of EMC Failure and Sensitivity Analysis With Regard to Uncertain Variables by Reliability Methods
IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2015, 57 (2), pp.274-282. ⟨10.1109/TEMC.2014.2378912⟩
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hal-02905733v1  Journal articles
Mourad LarbiRiccardo TrincheroFlavio CanaveroPhilippe BesnierMadhavan Swaminathan. Analysis of Parameter Variability in an Integrated Wireless Power Transfer System via Partial Least Squares Regression
IEEE Transactions on Components, Packaging and Manufacturing Technology, Institute of Electrical and Electronics Engineers, 2020, 10 (11), pp.1795-1802. ⟨10.1109/TCPMT.2020.3002226⟩
hal-03103325v1  Conference papers
M. LarbiR. TrincheroF.G. CanaveroPhilippe BesnierM. Swaminathan. Analysis of Parameter Variability in Integrated Devices by Partial Least Squares Regression
24th IEEE Workshop On Signal and Power Integrity, SPI 2020, May 2020, Cologne, Germany. pp.9218175, ⟨10.1109/SPI48784.2020.9218175⟩