Modeling the Temperature Bias of Power Consumption for Nanometer-Scale CPUs in Application Processors

Karel de Vogeleer (1, 2) , Gérard Memmi (1) , Pierre Jouvelot (3, 2) , Fabien Coelho (2, 3)

1 INFRES - Département Informatique et Réseaux
2 CRI - Centre de Recherche en Informatique
3 Mines Paris - PSL (École nationale supérieure des mines de Paris)

Mots clés: Temperature measurement; Leakage currents; Program processors; Heating; Voltage control; Computational modeling; Temperature distribution

Domaines: Systèmes embarqués; Performance et fiabilité [cs.PF]

Karel de Vogeleer, Gérard Memmi, Pierre Jouvelot, Fabien Coelho. Modeling the Temperature Bias of Power Consumption for Nanometer-Scale CPUs in Application Processors. Embedded Computer Systems: Architectures, Modeling, and Simulation (SAMOS XIV), Jul 2014, Samos, Greece. pp 172-180, ⟨10.1109/SAMOS.2014.6893209⟩. ⟨hal-01111647⟩