Note: Observation of the angular distribution of an x-ray characteristic emission through a periodic multilayer

Philippe Jonnard (1) , Meiyi Wu (1) , Jean-Michel André (1) , Karine Le Guen (1) , Zhanshan Wang (2) , Qiushi Huang (2) , Ian Vickridge (3) , Didier Schmaus (3, 4) , Emrick Briand (3, 5, 6, 7) , Sébastien Steydli (3) , Philippe Walter (8)

1 LCPMR - Laboratoire de Chimie Physique - Matière et Rayonnement
2 Tongji University
3 INSP - Institut des Nanosciences de Paris
4 UPD7 - Université Paris Diderot - Paris 7
5 SAFIR - Système d'Analyse par Faisceaux d'Ions Rapides
6 INSP-E5 - Couches nanométriques : formation, interfaces, défauts
7 SU - Sorbonne Université
8 LAMS - Laboratoire d'Archéologie Moléculaire et Structurale

We present the observation of the angular distribution of a characteristic x-ray emission through a periodic multilayer. The emission coming from the substrate on which the multilayer is deposited is used for this purpose. It is generated upon proton irradiation through the multilayer and detected with an energy sensitive CCD camera. The observed distribution in the low detection angle range presents a clear dip at a position characteristic of the emitting element. Thus, such a device can be envisaged as a spectrometer without mechanical displacement and using various ionizing sources (electrons, x-rays, and ions), their incident direction being irrelevant.

Domaines: Physique [physics]

Philippe Jonnard, Meiyi Wu, Jean-Michel André, Karine Le Guen, Zhanshan Wang, et al.. Note: Observation of the angular distribution of an x-ray characteristic emission through a periodic multilayer. Review of Scientific Instruments, 2018, 89 (9), pp.096109. ⟨10.1063/1.5040980⟩. ⟨hal-01882729⟩