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Communication Dans Un Congrès Année : 2006

Comparing TEM and resonant Raman spectroscopy for diameter distribution assessment of single wall carbon nanotubes

Résumé

Characterization of single wall carbon nanotube (SWCNT) population plays a key role to study the influence of growth parameters during their formation. Despite this crucial step, statistical data extracted from more than one characterization technique are rarely compared in publications claiming for SWCNT growth selectivity. Transmission Electron Microscopy and Raman spectroscopy are widely used to obtain an accurate measurement of the SWCNT diameters [1]. We used both techniques and observed a systematic shift between the diameter distributions assessed by Raman spectroscopy and TEM imaging in our typical SWCNT samples, CVD grown on SiO2/Si wafers (Figure 1)[2]. TEM image analyses were performed on samples transferred on TEM grids using the methodology we proposed in [3] whereas Raman spectra are recorded on the as grown samples and tube diameters were deduced from their radial breathing mode by following a procedure widely used in the literature [4]. Observed shift can be as high as 0.4 nm, which represents 20 to 30 % of the diameter values while measurement accuracy is estimated to be equal to 0.05 nm for both techniques. Furthermore, small tube diameters below 1.2 nm seem to be under-detected by TEM with respect to Raman whereas the opposite trend is observed for tube diameters larger than 1.5 nm. In this work, we explore the comparison between TEM imaging and Raman spectroscopy capabilities for determining the diameter distribution of a CVD grown sample, in an effort to validate, or invalidate, currently used methodologies.
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Dates et versions

hal-01993901 , version 1 (25-01-2019)

Identifiants

  • HAL Id : hal-01993901 , version 1

Citer

Alice Castan, S. Forel, Frederic Fossard, A. Ghedjatti, Costel Sorin Cojocaru, et al.. Comparing TEM and resonant Raman spectroscopy for diameter distribution assessment of single wall carbon nanotubes. 19th International Microscopy Congress (IMC19), Sep 2018, Sydney, Australia. ⟨hal-01993901⟩
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