W. Bangerth, A. Joshi, and E. M. Sevick-muraca, Adaptive FE methods for increased resolution in fluorescence optical tomography, Progress in Biomedical Optics and Imaging, pp.318-329, 2007.

L. Beilina and C. Clason, An Adaptive Hybrid FEM/FDM Method for an Inverse Scattering Problem in Scanning Acoustic Microscopy, SIAM Journal on Scientific Computing, vol.28, issue.1, pp.1-1, 2006.
DOI : 10.1137/050631252

L. Beilina and C. Johnson, ERROR ESTIMATION IN COMPUTATIONAL INVERSE SCATTERING, Mathematical Models and Methods in Applied Sciences, vol.15, issue.01, pp.1-1, 2005.
DOI : 10.1142/S0218202505003885

K. Ishizuka and N. Uyeda, A new theoretical and practical approach to the multislice method, Acta Crystallographica Section A, vol.33, issue.5, pp.740-749, 1977.
DOI : 10.1107/S0567739477001879

E. J. Kirkland, Advanced Computing in Electron Microscopy, 1998.

A. V. Popov, Computation of paraxial wave fields using transparent boundary conditions, Computational Mathematics and Mathematical Physics, vol.46, issue.9, pp.1595-1600, 2006.
DOI : 10.1134/S0965542506090107

G. Puel and D. Aubry, Identification of a Spatial Field of Material Properties With Adaptive Regularization and Meshes, Volume 3: 28th Computers and Information in Engineering Conference, Parts A and B, pp.p. (CD-ROM, 2008.
DOI : 10.1115/DETC2008-49754
URL : https://hal.archives-ouvertes.fr/hal-00315371

P. Schattschneider, J. Verbeeck, and A. L. Hamon, Real space maps of atomic transitions, Ultramicroscopy, vol.109, issue.7, pp.781-787, 2009.
DOI : 10.1016/j.ultramic.2009.01.016
URL : https://hal.archives-ouvertes.fr/hal-00751931

A. R. Smith and L. Eyring, Calculation, display and comparison of electron microscope images modelled and observed, Ultramicroscopy, vol.8, issue.1-2, pp.65-78, 1982.
DOI : 10.1016/0304-3991(82)90277-7

P. A. Stadelmann, EMS - a software package for electron diffraction analysis and HREM image simulation in materials science, Ultramicroscopy, vol.21, issue.2, pp.131-146, 1987.
DOI : 10.1016/0304-3991(87)90080-5

R. Verfurth, A review of a posteriori error estimation and adaptive mesh-refinement techniques, 1996.

Z. L. Wang, Elastic and inelastic scattering in electron diffraction and imaging, 1995.
DOI : 10.1007/978-1-4899-1579-5

D. B. Williams and C. B. Carter, Transmission electron microscopy, ANNEXE POUR LE SERVICE FABRICATION, 1996.
DOI : 10.1007/978-1-4757-2519-3

T. De-l-', ARTICLE : Elastic electron scattering using the Finite Element Method: forward and inverse problems

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