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A Classification Framework for Predicting Components' Remaining Useful Life Based on Discrete-Event Diagnostic Data

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https://hal-ecp.archives-ouvertes.fr/hal-01340350
Contributor : Yanfu Li <>
Submitted on : Thursday, June 30, 2016 - 10:32:45 PM
Last modification on : Wednesday, July 15, 2020 - 10:00:02 AM

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Olga Fink, Enrico Zio, Ulrich Weidmann. A Classification Framework for Predicting Components' Remaining Useful Life Based on Discrete-Event Diagnostic Data. IEEE Transactions on Reliability, Institute of Electrical and Electronics Engineers, 2015, 64, pp.1049-1056. ⟨10.1109/tr.2015.2440531⟩. ⟨hal-01340350⟩

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