Measurements of high energy loss rates of fast highly charged U ions channeled in thin silicon crystals

C. Ray (1) , A. Bräuning-Demian , H. Bräuning , M. Chevallier (2) , C. Cohen (3) , D. Dauvergne (1) , A. L'Hoir (3) , C. Kozhuharov , D. Liesen , P. H. Mokler , J.-C. Poizat (1) , Th. Stöhlker , E. Testa (1) , M. Toulemonde

1 IPNL - Institut de Physique Nucléaire de Lyon
2 CAS-PHABIO
3 INSP - Institut des Nanosciences de Paris

Domaines: Physique Atomique [physics.atom-ph]

C. Ray, A. Bräuning-Demian, H. Bräuning, M. Chevallier, C. Cohen, et al.. Measurements of high energy loss rates of fast highly charged U ions channeled in thin silicon crystals. Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2011, 84, pp.024119. ⟨10.1103/PhysRevB.84.024119⟩. ⟨in2p3-00609765⟩